Part Number: MD2764-25 B | Manufacturer: Intel Corporation | NSN: 5962-01-176-3078 (5962011763078) |
Item Name : Microcircuit Memory | CAGE Code: 34649 | FSC: 5962 Microcircuits Electronic |
Alternate P/N : MD276425B |
The NSN Part MD2764-25 B Microcircuit Memory. is ready-to-ship today! Please request a quote by filling out the form. All fields are important. The NSN number for MD2764-25 B is 5962011763078. The manufacturer of this part is Intel Corporation. A dedicated customer service executive will contact you within 15 minutes of receiving the RFQ.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-176-3078 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 011763078 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
AM2764-30DMB | 5 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.460 INCHES NOMINAL |
ADAT | BODY WIDTH | 0.610 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/150.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | LANDING CRAFT AIR CUSHION (LCAC),TARAWA CLASS LHA,NIMITZ CLASS CVN,FORRESTAL CLASS CV,EMORY S. LAND,WASP CLASS LHD. B-1B AIRCRAFT. 2M/ATE MICROMINIAUTURE AUTOMATIC TEST EQUIPMENT. |
CBBL | FEATURES PROVIDED | PROGRAMMABLE AND HERMETICALLY SEALED AND 3-STATE OUTPUT AND ULTRAVIOLET ERASABLE |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 16 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.6 VOLTS MINIMUM POWER SOURCE AND 22.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT |
CZER | MEMORY DEVICE TYPE | ROM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
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