| Alternative NSN: 5962-01-518-3613 |
| Item Name:Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 015183613 |
| NCB Code: USA (01) |
| Manufacturers: Altera Corporation , Bae Systems Controls Inc |
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 356A1409 | Altera Corporation | microcircuit memory | Avl | RFQ |
| 356A1409P32 | Bae Systems Controls Inc | microcircuit memory | Avl | RFQ |
| 356A1409P32 | Altera Corporation | microcircuit memory | Avl | RFQ |
| 89954-356A1409P32 | Altera Corporation | microcircuit memory | Avl | RFQ |
| EPM7256SQC208-7 | Altera Corporation | microcircuit memory | Avl | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| CZEP | Capitance Rating Per Characteristic | 10.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
| TTQY | Terminal Type And Quantity | 208 GULLWING |
| CZEQ | Time Rating Per Chacteristic | 7.50 NANOSECONDS MAXIMUM PROPAGATION DELAY |
| CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT, PROGRAMABLE LOGIC DEVICE, MAX 7000 SERIES, PLASTIC ENCAPSULATED (SURFACE MOUNT) |
| TEST | Test Data Document | 89954-356A1407 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| CBBL | Features Provided | ELECTROSTATIC SENSITIVE AND ELECTRICALLY ALTERABLE |
| CQSJ | Inclosure Material | PLASTIC |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| ADAT | Body Width | 27.9 MILLIMETERS MINIMUM AND 28.1 MILLIMETERS MAXIMUM |
| ADAQ | Body Length | 27.9 MILLIMETERS MINIMUM AND 28.1 MILLIMETERS MAXIMUM |
| FEAT | Special Features | 5000 GATES, EEPROM-BASED |
| MRC | Decoded Requirement | Clear Text Reply |
| ADAU | Body Height | 3.2 MILLIMETERS MINIMUM AND 3.6 MILLIMETERS MAXIMUM |
| AGAV | End Item Identification | C-17A AIRCRAFT |
| CQSZ | Inclosure Configuration | LEADED CHIP CARRIER |
| CZER | Memory Device Type | PAL |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL | Criticality Code Justification | CBBL |
| SPCL | Special Test Features | UPSCREENING TESTING CONSISTING OF EXTENDED TEMPERATURE RANGE TESTING |
| CZEN | Voltage Rating And Type Per Characteristic | 4.5 VOLTS MINIMUM POWER SOURCE AND 5.2 VOLTS MAXIMUM POWER SOURCE |
| 5905-00-000-0136 (5905000000136) |
5905-00-001-2573 (5905000012573) |
5905-00-001-2812 (5905000012812) |
5905-00-001-2813 (5905000012813) |
| 5905-00-001-2814 (5905000012814) |
5905-00-001-2815 (5905000012815) |
5905-00-001-2818 (5905000012818) |
5905-00-001-2819 (5905000012819) |
| 5905-00-001-2821 (5905000012821) |
5905-00-001-2822 (5905000012822) |
5905-00-001-2826 (5905000012826) |
5905-00-001-2827 (5905000012827) |
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