1H5010CDD Manufactured by Philips Semiconductors Inc - Order Online

Part Number: 1H5010CDD

Manufacturer: philips semiconductors inc

NSN: 5962-00-615-5018

Item Name : microcircuit linear

CAGE Code: 18324

FSC: 5962 Microcircuits Electronic

INC Code: 31778

Country: USA

NCB Code: 00

FSG: 59 Electrical and Electronic Equipment Components

The NSN Part 1H5010CDD Microcircuit Linear is ready-to-ship today! Please request a quote by filling out the form. All fields are important. The NSN number for 1H5010CDD is 5962-00-615-5018. The manufacturer of this part is Philips Semiconductors Inc. A dedicated customer service executive will contact you within 15 minutes of receiving the RFQ.

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NSN Information for Part Number 1H5010CDD with NSN 5962-00-615-5018, 5962006155018

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-00-615-5018 Item PartTypeName: MICROCIRCUIT,LINEAR	5962	006155018	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		B	U	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
IH5010MJD/883B	3	9	3

Characteristics Data of NSN 5962-00-615-5018, 5962006155018

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.660 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
ADAT	BODY WIDTH	0.220 INCHES MINIMUM AND 0.280 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	500.0 MILLIWATTS
AFGA	OPERATING TEMP RANGE	-55.0/125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0/150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	MONOLITHIC AND HERMETICALLY SEALED AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS AND LOW LEVEL AND W/FIELD EFFECT TRANSISTOR SWITCH AND EXTERNALLY COMPENSATED
CQSJ	INCLOSURE MATERIAL	CERAMIC AND GLASS
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQZP	INPUT CIRCUIT PATTERN	4 CHANNEL
CSSL	DESIGN FUNCTION AND QUANTITY	1 SWITCH,ANALOG
CTFT	CASE OUTLINE SOURCE AND DESIGNATOR	T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL
CWSG	TERMINAL SURFACE TREATMENT	TIN
CZEQ	TIME RATING PER CHACTERISTIC	500.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 500.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).