B4012153 Manufactured by Department Of The Army Hq United States Army Communications Research And Develop - Order Online

Part Number: B4012153

Manufacturer: department of the army hq united states army communications research and develop

NSN: 5962-01-244-8514

Item Name : microcircuit memory

CAGE Code: 56996

FSC: 5962 Microcircuits Electronic

INC Code: 41015

Country: USA

NCB Code: 01

FSG: 59 Electrical and Electronic Equipment Components

The NSN Part B4012153 Microcircuit Memory is ready-to-ship today! Please request a quote by filling out the form. All fields are important. The NSN number for B4012153 is 5962-01-244-8514. The manufacturer of this part is Department Of The Army Hq United States Army Communications Research And Develop. A dedicated customer service executive will contact you within 15 minutes of receiving the RFQ.

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NSN Information for Part Number B4012153 with NSN 5962-01-244-8514, 5962012448514

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-244-8514 Item PartTypeName: MICROCIRCUIT,MEMORY	5962	012448514	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
B4012153	5	2	3

Characteristics Data of NSN 5962-01-244-8514, 5962012448514

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	2.010 INCHES MAXIMUM
ADAT	BODY WIDTH	0.900 INCHES NOMINAL
ADAU	BODY HEIGHT	0.260 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	1.0 WATTS
AFGA	OPERATING TEMP RANGE	-46.0/110.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0/150.0 DEG CELSIUS
AGAV	END ITEM IDENTIFICATION	7010-01-085-4310 COMPUTER TERMIN
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND ELECTROSTATIC SENSITIVE AND HIGH RELIABILITY
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	19 INPUT
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	RAM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	40 PRINTED CIRCUIT