B4026974-4 Manufactured by Department Of The Army Hq United States Army Communications Research And Develop - Order Online

Part Number: B4026974-4

Alternate P/N: B40269744

Manufacturer: department of the army hq united states army communications research and develop

NSN: 5962-01-177-2895

Item Name : microcircuit memory

CAGE Code: 56996

FSC: 5962 Microcircuits Electronic

INC Code: 41015

Country: USA

NCB Code: 01

FSG: 59 Electrical and Electronic Equipment Components

The NSN Part B4026974-4 Microcircuit Memory is ready-to-ship today! Please request a quote by filling out the form. All fields are important. The NSN number for B4026974-4 is 5962-01-177-2895. The manufacturer of this part is Department Of The Army Hq United States Army Communications Research And Develop. A dedicated customer service executive will contact you within 15 minutes of receiving the RFQ.

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NSN Information for Part Number B4026974-4 with NSN 5962-01-177-2895, 5962011772895

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-177-2895 Item PartTypeName: MICROCIRCUIT,MEMORY	5962	011772895	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	7		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
ROM/PROM FAMILY 013	2	1	5

Characteristics Data of NSN 5962-01-177-2895, 5962011772895

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.840 INCHES MAXIMUM
ADAT	BODY WIDTH	0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.185 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	739.0 MILLIWATTS
AFGA	OPERATING TEMP RANGE	-55.0/125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0/150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	BIPOLAR AND SCHOTTKY AND PROGRAMMABLE
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	6 INPUT
CTFT	CASE OUTLINE SOURCE AND DESIGNATOR	D-2 MIL-M-38510
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	80.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 80.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	ROM
TEST	TEST DATA DOCUMENT	81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI
TTQY	TERMINAL TYPE AND QUANTITY	16 PRINTED CIRCUIT