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MRC | Criteria | Characteristic |
---|---|---|
CXCY | III PART NAME ASSIGNED BY CONTROLLING AGENCY | PLANO-INTERFEROMETER |
ABKW | OVERALL HEIGHT | 26.000 INCHES NOMINAL |
FEAT | SPECIAL FEATURES | MEASURE FLATNESS MASTER REFERENCE CERTIFIED 1/10 FRINGE MIN. OR TO 0.0000001 INCH OVER THE ENTIRE APERATURE; WORKING APERATURE 5"" DIA.; DIMENSION WORK TABLE 8 INCHES BY 8 INCHES |
FTLD | III FUNCTIONAL DESCRIPTION | MEASURES SURFACE FLATNESS OF MATERIALS SUCH AS POLISHED GLASS OR CRYSTAL, OR LAPPED METAL SURFACES SUFFICIENTLY FLAT ENOUGH TO REFLECT LIGHT; DESIGNED FOR USE EITHER IN THE LAB OR ON PRODUCTION LINE |
Guaranteed on-time |
|
Customized and |
|
Over 5100 |
|
Complete Purchasing |